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TEL 推出单颗芯片测试探针台 Prexa SDP，面向先进封装 KGD 筛选: 半导体制造设备供应商 TOKYO ELECTRON (TEL) 当地时间本月 16 日宣布推出面向切割后单颗芯片测试的芯片探针台 Prexa S...[全文]

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IC目录索引: A B C D E F G H I J K L M N O P Q R S T U V W X Y Z 0 1 2 3 4 5 6 7 8 9

索引 0-9:: 2071; 1.5SMC24A-E3/9AT; 9000-033-PFP; 2000976; 70233-116LF; 002-067; 20021612-00010T4LF; 2010; 00 6200 087 032 800+; 7009-1813-02; 201647; 1.5KE16A/CA; 1.5KE160C; 3006P-1-104LF; 70215; 3.9K; 80015; 0.1UF 50V; 900293-1; 200V1800UF; 2 227 355 752; 2007250-1; 800-10-064-10-001000; 700013; 1.5KE15CA-T; 0.1R; 4.096MHZ; 4.500mhz; 1.5KE20ARL4G; 50000-1096E

索引 A-I:: C0603C103K2RACTU; C0510X5R1C104M030AC; F1CA024V; A2208; I5128; h0056nlt; IA0505S-2W; B0312T-W2; G.75X.75LG6; A1318LLHLT-2-T; AMS2596M-5.0; D1313; C1173; CXD2408AR; D051212D-1W; A0001T; B28B-PHDSS; B32520C1474J189; G1024; D0120MY-A1H; B1035CL; D1192; B06B-PASK-1; A025DN01; A09-HSM-7; I1-200-5; D1713AG-650; A-2001A; A085FW01; B02B-XASS-1-T

索引 J-R:: M24C04-WBN6P; M27C1001-12C6; MMBT4209; P0080SD; P0640SBMCL; Q0270; P13C3125WE; p0080ebl; L3102; P0177NL; M12L128168A-6T; K010; L-113SRSGWT; L-119SURKCGKWT; M1106; K07N120; LBWA18HEPZ-135; M29W800DT45ZE6E; K1083; M208B1; L0603C18NJRMST; M1203; MSP430F5310IRGZR; P0846; J00-0064NL; P0080; M24C16-MN6T; P01N02LMA; RTC63421A; L4940D2T10

索引 S-Z:: S-1112B33MC-L6S-TFG; V1008GBE65; S1D13504F01A200; U209B-MY; T0805F105ZNT; W.FL-R-SMT-1(10); S05K175G; T1320A; S-1170B33PD-OTS-TFG; T1451; S-1000C33-M5T1G; S-1112B48MC; T2904; V0402MHS12NR; T081; T24C02; W170-01GC; T491D477M006AH; U1620; T3714; S1087; T720165504GF; T495D107K010ATE100; T1035H-6T; T136; S08U25-600A; W107DIP-8; TAJB106M025RNJ; S12B-XH-A(LF)(SN); UC1708