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TEL 推出单颗芯片测试探针台 Prexa SDP，面向先进封装 KGD 筛选: 半导体制造设备供应商 TOKYO ELECTRON (TEL) 当地时间本月 16 日宣布推出面向切割后单颗芯片测试的芯片探针台 Prexa S...[全文]

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IC目录索引: A B C D E F G H I J K L M N O P Q R S T U V W X Y Z 0 1 2 3 4 5 6 7 8 9

索引 0-9:: 20021321-00014T4LF; 6.000M; 5.007A0-024-1R0; 80010; 2005247-1; 6.144MHZ; 70020FB; 9002; 1.5KE380A; 4.096MHZ; 4.7UF16V; 20021311-00050T4LF; 301R153U7R5JL2; 300568ez; 6.3V560UF; 9001-12641C00A; 102241-4; 1.5KE12A; 7052-LF; 207360-1; 702-0300; 10026A; 2108; 20.480MHZ; 54722-0404; 2N7002PW; 800-10-064-10-002000; 1.5ke250; 80188; 4.000MHZ

索引 A-I:: A104K20X7RH5TAA; H11AV1; AS5040; F03-03 HAS B LOCK-NUT; IR21064S; G0525353(RL5C480); D1106S; C0201-TLM-E; A1308AT; A00B; AR7130-BC1A; C009; H11A817.S(Q); B05B-CZHK-B-1; E13007-1/2; E/UK; B160-E3/5AT; H1081; A400; G1422; E05A02LA; D10040250GT; B01CS08L; IA08BLN25NO; D1067; E16017B; H1117; A22L-CW-T2-20M; F007C; C1608X7R1H563KT

索引 J-R:: P0597NLT; N.FL-R-SMT-1(10); REG104GA-5G4; L00A; P1806; L-144IDT; L05Z800S15; L132XID; M1AGL250V2-VQG100I; L054BT26; L-113GDT; M2003; P0107; M20-1180046; L-07C3N3SV6T; L308; K0305; M22520/2-07; M10002-H; J00-0063NL; P027; Q13FC1350000200; N010-0550-T613; L-1503GD; L083S562G; M12L128168A-6TIG; Q100; K118GR; L64724-75; P0425AD

索引 S-Z:: X25170S; S-1132B15-I6T2G; SAM-1245-10K; S1101; T1635H-6G; S111715Q; S08B-XASK-1(LF)(SN); S-150-9; T25C6; S25FL128P0XMFI001; S2006F1; X0403NF; S11B-PH-K-S(LF)(SN); T272C; T108DL; SI7840DP; S163PC; S0450SMDA03-7; S1133-14; Z0292212VSGR3910; S10K420E2; t491a225m020as; T495D227K010ZTE100; U1DL44A; U10GWJ2C48C-TE24L; S1D15100F00C100; T508N14TOF; S100W; V07E11P; V00570002ADGB